The crystalline structure and thickness of the BaFe12O19 film were characterized by a Rigaku SmartLab XRD/XRR (x-ray reflectivity) system. A MicroSense EV7 vibrating sample magnetometer (VSM) and a Quantum Design DynaCool VSM were used to measure the magnetization curves at different T. After the Bi2Se3 film was grown on the BaFe12O19 film in the MBE system, RHEED was performed in situ to examine the crystalline structure of the Bi2Se3 film.

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