Measurements were performed using the cryogenic photoemission electron microscope PEEM3 at beamline 11.0.1 at the Advanced Light Source (23). Magnetic images were recorded by taking advantage of XMCD at the Fe L3-edge (24). The obtained contrast is a measure of the projection of the magnetization on the x-ray polarization vector so that nanomagnets with a magnetization parallel or antiparallel to the x-ray polarization appear either black or white. Nanomagnets with moments having ±45° and ±135° angles with respect to the incoming x-rays appear dark and bright, respectively. The silicon plateaus do not generate any disturbing background or shadow signal (13).

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