GIWAXS samples were prepared by spin-coating a film from chlorobenzene (as previously described) onto a Si wafer. The samples were measured at beamline 11-3 at the Stanford Synchrotron Radiation Lightsource (SSRL), in a helium-filled chamber, at an incidence angle of 0.12°, with a Rayonix Mar CCD225 detector. The sample-to-detector distance was 300 mm. An x-ray beam wavelength of 0.9758 Å and an exposure time of 400 s were used. The data were processed using the WaveMetrics Igor Pro with a Nika script and WAXStools software.

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