The x-ray scattering measurement was performed with a Pilatus3R 300K detector [Bruker Nanostar SAXS in X-ray Diffraction Shared Experimental Facility at Massachusetts Institute of Technology (MIT)]. We used a small-angle 2-mm beamstop with a sample-detector distance of 1059.1 mm for SAXS measurements and a wide-angle 2-mm beamstop with a sample-detector distance of 109.1 mm for WAXS measurements. The exposure time was set as 300 s. Raw SAXS and WAXS patterns were processed with corrections by MATLAB-based GIXSGUI software before analysis.

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