Soft x-ray ARPES measurements were performed at the Advanced Resonant Spectroscopies (ADRESS) beamline at the Swiss Light Source with a SPECS PHOIBOS-150 analyzer (40) and the “Dreamline” beamline of the Shanghai Synchrotron Radiation Facility (SSRF) with a Scienta Omicron DA30L analyzer. Most of the soft x-ray ARPES data were taken at the ADRESS beamline, with the overall energy resolution varied from 40 to 100 meV. VUV ARPES measurements were performed at the Dreamline beamline of SSRF with a Scienta Omicron DA30L analyzer and at the 13U beamline of the National Synchrotron Radiation Laboratory at Hefei with a Scienta Omicron R4000 analyzer. In the soft x-ray ARPES experiments, to eliminate the surface states, the samples were cleaved in air and then transferred to the vacuum chamber. However, we found that the surface states could also be eliminated for very few samples cleaved in high vacuum. In the VUV ARPES experiments, all the samples were cleaved in high vacuum. The measurements were performed at 20 K with vacuum condition better than 5 × 10−11 torr.

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