SEM and TEM characterizations were carried out using a Hitachi S-4800 SEM and a JEOL 2100 TEM, respectively. HAADF-STEM imaging was performed on a JEOL ARM200F microscope with a STEM aberration corrector operated at 200 kV. The BET surface area was determined from nitrogen adsorption data measured at 77 K on an ASAP 2020 physisorption analyzer (Micromeritics Inc., USA). The loading masses of ZnxCo1−xO and P-CoO NRs on CFP substrates were measured using inductively coupled plasma mass spectrometry (NexION 300Q, PerkinElmer).

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