SAD was performed at room temperature using a commercial TEM (Tecnai G2 Spirit TWIN, FEI) with a 120-kV electron beam energy. An SAD aperture was inserted into the beam path, so only a 1.1-μm-diameter circular area on the sample was illuminated by the electrons. High-resolution bright-field micrographs were taken with the same instrument, as shown in Fig. 2E and fig. S3.

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