Diffraction data were collected on an FEI Titan at 300 keV. All images, including diffraction from a polycrystalline Cu standard, were collected with the same microscope alignments. To correct for small amounts of ellipticity in the diffraction patterns due to microscope aberrations, peak positions were identified in the Cu diffraction data. A correction matrix was calculated from the elliptical fit to the points. The correction matrix was then used to determine a corrected set of image coordinates. Resampling the images according to the corrected coordinates yielded corrected images. After calculating and applying the correction to the Cu standard, the same procedure was carried out on the WSe2 diffraction patterns.

Note: The content above has been extracted from a research article, so it may not display correctly.

Please log in to submit your questions online.
Your question will be posted on the Bio-101 website. We will send your questions to the authors of this protocol and Bio-protocol community members who are experienced with this method. you will be informed using the email address associated with your Bio-protocol account.

We use cookies on this site to enhance your user experience. By using our website, you are agreeing to allow the storage of cookies on your computer.