Diffraction data were collected on an FEI Titan at 300 keV. All images, including diffraction from a polycrystalline Cu standard, were collected with the same microscope alignments. To correct for small amounts of ellipticity in the diffraction patterns due to microscope aberrations, peak positions were identified in the Cu diffraction data. A correction matrix was calculated from the elliptical fit to the points. The correction matrix was then used to determine a corrected set of image coordinates. Resampling the images according to the corrected coordinates yielded corrected images. After calculating and applying the correction to the Cu standard, the same procedure was carried out on the WSe2 diffraction patterns.

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