The structures and compositions of MGT were characterized by SEM, TEM, XRD, FTIR, XPS, and Raman spectroscopy. TEM images were obtained using a JEM2100 transmission electron microscope operated at an accelerating voltage of 200 kV. HR-TEM images were taken using a JEM-2100F transmission electron microscope with an accelerating voltage of 200 kV. SEM measurements were performed using a field emission SEM (FEI Helios G4 UC) operated under UC (UniColore) mode at 1 kV + 1000 V UC. XRD patterns were measured by a D/max2550VB3+/PC x-ray diffractometer using Cu (40 kV, 100 mA). FTIR spectra were recorded on a Nicolet iS10 infrared spectrometer (Thermo Fisher Scientific, USA). XPS data were performed on an XPS (AXIS Ultra DLD, Japan) equipped with an Al Kα (1486.6-eV photons). SERS was performed on a Thermo Fisher Scientific DXR Raman microscope with a 10× [numerical aperture (NA), 0.4] microscope and a 10-mW laser power for SERS measurements.

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