The structure and composition of the 8-period SL samples were characterized by PNR, performed at the Polarized Beam Reflectometer beamline at the National Institute of Standards and Technology (NIST) Center for Neutron Research, with an in-plane guide field μ0H = 0.7 T and at T = 4 K (fig. S3). Compared with the 8% ErAs sample, the 25% ErAs sample showed a shallower dip, indicating an increase in interface roughness upon the addition of the ErAs nanodots. The higher-frequency oscillations observed for the 25% ErAs SL indicate a slight increase in the lattice period, which is quite reasonable since the lattice constant of ErAs exceeds that of GaAs by 1.53%. To understand the detailed structure and further information about the concentration of ErAs at the interfaces, we refined the PNR curves using a differential evolution algorithm by GenX (43), where the structure, roughness, and ErAs concentration were extracted. The results are consistent with those observed with TEM analysis.

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