The cross-sectional TEM samples for strain mapping studies were prepared using the focused ion beam technique with additional ion milling process. To realize high-resolution TEM-based strain mapping, the 300-period SLs were thinned both bottom-to-top and top-to-bottom to make the bottom region and the top region comparable. HRTEM images were acquired using the high-angle annular dark-field detector on a double aberration correction JEOL ARM-200CF at Brookhaven National Laboratory. The strain maps were retrieved using geometric phase analysis from HRTEM images by selecting substrate areas as a reference (41, 42).

Note: The content above has been extracted from a research article, so it may not display correctly.



Q&A
Please log in to submit your questions online.
Your question will be posted on the Bio-101 website. We will send your questions to the authors of this protocol and Bio-protocol community members who are experienced with this method. you will be informed using the email address associated with your Bio-protocol account.



We use cookies on this site to enhance your user experience. By using our website, you are agreeing to allow the storage of cookies on your computer.