HRTEM images and EELS spectra were taken on an FEI Titan 60-300 electron microscope equipped with a spherical aberration (Cs) corrector in the image-forming (objective) lens and a monochromator, operated under 80 kV. HRTEM simulation was performed by using the multislice method implemented in QSTEM software (33). Simulation conditions used were as follows: 80 kV; Cs = 10 μm; Cc = 1 mm; ΔE = 0.13 eV; Δf = 68 nm; α = 0.2 mrad; focal spread = 5 nm; an objective aperture was used.

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