SEM images were captured in a FEI XL30 Sirion SEM. TEM characterization was performed at 300 kV using a FEI Titan TEM. The morphology of plated Li was observed with a FIB (Nova 600i Dual Beam, FEI). The cycled electrodes were cross-sectioned with a Ga+ ion beam and observed with the SEM (JSM-6700F, JEOL). X-ray photoelectron spectroscopy (XPS) was performed on PHI 5000 VersaProbe, using an Al Kα (λ = 0.83 nm, hυ = 1486.7 eV) x-ray source operated at 2 kV and 20 mA.

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