Photoluminescence setup

LL L. Leandro
RR R. Reznik
JC J. D. Clement
JR J. Repän
MR M. Reynolds
EU E. V. Ubyivovk
IS I. V. Shtrom
GC G. Cirlin
NA N. Akopian
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The optical measurements have been performed in a closed-cycle He cryostat. A continuous wave laser at 532 nm was used for above bandgap excitation for all photoluminescence measurements, while a 400 nm pulsed laser (temporal pulse full width half maximum ~90 ps) was used for lifetime measurements. Scanning-PL measurements have been performed in a micro-PL configuration, scanning in a straight line for 30 s on the sample kept at 2 K (except for temperature dependent PL measurements). The spectrum is measured using a low-noise charge-coupled device connected to a 75 cm long spectrometer. The same setup, has been used for micro-PL measurements of individual nanowires. Macro-PL measurements have been done using a similar setup, with a lens with larger focal length, without any scanning. The lifetime is measured with a fast single-photon detector (~50 ps jitter) combined with time-tagging electronics (~100 ps jitter).

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